Dmitry V. Boychenko

Часть публикаций из профиля, по году от новых к старым. Это не полный список последних работ автора; работы без года — в конце.

• Radiation-Based Methods for Process and Layout Variablity Inspection of Trustworthy ICs2025
• STATISTICAL METHODS USAGE TO IMPROVE DIE WAFERS RADIATION MONITORING EFFICIENCY IN MASS PRODUCTION PROCESS2025
• SINGLE EVENT EFFECTS RADIATION TESTING REQUIREMENTS: A BAYESIN AN APPROACH2025
• Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. I. System and Implementation Algorithms for Various Product Categories2024
• Predictive Analysis of Microcircuits’ Radiation Hardness in the Fabrication Process. II. Selection of Test Objects and the Statistical Processing of the Obtained Results2024
• Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM2015 · аннотациясвернуть

  The temperature dependence of single-event upset multiplicity in 65 nm CMOS SRAM was investigated in this paper. Experimental results show significant increase of upset multiplicity over a temperature range of 300 to…

• Total ionizing dose effects and radiation testing of complex multifunctional VLSI devices2015 · аннотациясвернуть

  Total ionizing dose (TID) effects and radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional ?simple? ICs. The…

• The New Gamma Irradiation Facility at the National Research Nuclear University MEPhI2014 · аннотациясвернуть

  The new gamma irradiation facility recently installed at the National Research Nuclear University MEPhI (Moscow, Russia) is presented.