I. A. Kharitonov

Часть публикаций из профиля, по году от новых к старым. Это не полный список последних работ автора; работы без года — в конце.

• TCAD-SPICE Analysis of SEU and Reliability in Space-Grade SRAM from 90 nm to 28 nm2025
• Оценка деформаций повторно используемых подготовительных выработок на пологозалегающих угольных пластах2025
• Features of TCAD and SPICE Simulation of a Charged Particle Impact into a 6T SRAM Cell Manufactured Using the CMOS 28-nm Technology Node2024
• Assessment of contour deformations of reused mine workings2024
• Multi-level Electro-Thermal Simulation of Power PCB Electronic Modules for Motor Driving2023
• Automation of parameter extraction procedure for Si JFET SPICE model in the −200…+110°C temperature range2018 · аннотациясвернуть

  Through the analysis of JFET models with account for temperature effects, the most suitable one was selected as a basis for expanding SPICE modeling possibilities to cryogenic-to-high temperature range. Parameter…

• Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C)2017
• International key comparison of measurements of neutron source emission rate (1999–2005): CCRI(III)-K9.AmBe2011 · аннотациясвернуть

  Section III (neutron measurements) of the Comite Consultatif des Rayonnements Ionisants, CCRI, conducted a key comparison of primary measurements of the neutron emission rate of an 241 Am-Be(α,n) radionuclide source. A…